Electrical and mechanical probing of nanostructures with transmission electron microscopy

Citation

• Costa, P. M. F. J., Bando, Y., & Golberg, D. (2009). Electrical and mechanical probing of nanostructures with transmission electron microscopy. Microscopy and Microanalysis, 15(S3), 47-48. doi:10.1017/s1431927609990699

Digital Object Identifier (doi)

• 10.1017/s1431927609990699

Web Of Science Accession Number

Start Page

• 47

End Page

• 48

Volume

• 15

Issue

• S3

Place Of Publication

Abstract

UOW Authors

•   Bando, Yoshio

Publication Date

• 2009

Publisher

• Cambridge University Press (CUP) 

Published In

• Microscopy and Microanalysis  Journal

Citation

• Costa, P. M. F. J., Bando, Y., & Golberg, D. (2009). Electrical and mechanical probing of nanostructures with transmission electron microscopy. Microscopy and Microanalysis, 15(S3), 47-48. doi:10.1017/s1431927609990699

Digital Object Identifier (doi)

• 10.1017/s1431927609990699

Web Of Science Accession Number

Start Page

• 47

End Page

• 48

Volume

• 15

Issue

• S3

Place Of Publication