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Use of high-energy synchrotron diffraction for residual stress analyses

Journal Article


Abstract


  • The application of high-energy synchrotron diffraction (HESD) for residual stress analysis was studied at the high-energy beam line ID15A in Grenoble, France. The measurements were performed using an 80 μm slit in the incoming beam and two 100 μm slits in the reflected beam. The main advantages of HESD are illustrated in three examples, namely: a ceramic matrix composites (CMC); a thermal barrier coating (TBC); and a cold-forward-extruded steel sample. From the examples of HESD residual stress analysis on a CMC, a TBC, and a textured sample demonstrated that the method has strong advantages with respect to the high penetration depth and the high local resolution achievable, as well as to the simultaneous investigation of residual stresses and texture.

Publication Date


  • 1999

Citation


  • Reimers, W., Pyzalla, A., Broda, M., Brusch, G., Dantz, D., Schmackers, T., . . . Tschentscher, T. (1999). Use of high-energy synchrotron diffraction for residual stress analyses. Journal of Materials Science Letters, 18(7), 581-583. doi:10.1023/A:1006651217517

Scopus Eid


  • 2-s2.0-0032670815

Start Page


  • 581

End Page


  • 583

Volume


  • 18

Issue


  • 7

Abstract


  • The application of high-energy synchrotron diffraction (HESD) for residual stress analysis was studied at the high-energy beam line ID15A in Grenoble, France. The measurements were performed using an 80 μm slit in the incoming beam and two 100 μm slits in the reflected beam. The main advantages of HESD are illustrated in three examples, namely: a ceramic matrix composites (CMC); a thermal barrier coating (TBC); and a cold-forward-extruded steel sample. From the examples of HESD residual stress analysis on a CMC, a TBC, and a textured sample demonstrated that the method has strong advantages with respect to the high penetration depth and the high local resolution achievable, as well as to the simultaneous investigation of residual stresses and texture.

Publication Date


  • 1999

Citation


  • Reimers, W., Pyzalla, A., Broda, M., Brusch, G., Dantz, D., Schmackers, T., . . . Tschentscher, T. (1999). Use of high-energy synchrotron diffraction for residual stress analyses. Journal of Materials Science Letters, 18(7), 581-583. doi:10.1023/A:1006651217517

Scopus Eid


  • 2-s2.0-0032670815

Start Page


  • 581

End Page


  • 583

Volume


  • 18

Issue


  • 7