In situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope

Citation

• Golberg, D., Mitome, M., Kurashima, K., Zhi, C. Y., Tang, C. C., Bando, Y., & Lourie, O. (2006). In situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope. APPLIED PHYSICS LETTERS, 88(12), 3 pages. doi:10.1063/1.2186987

Digital Object Identifier (doi)

• 10.1063/1.2186987

Web Of Science Accession Number

• WOS:000236250100096

Number Of Pages

• 3

Volume

• 88

Issue

• 12

Place Of Publication

Abstract

UOW Authors

•   Bando, Yoshio

Publication Date

• 2006

Publisher

• AMER INST PHYSICS 

Published In

• APPLIED PHYSICS LETTERS  Journal

Citation

• Golberg, D., Mitome, M., Kurashima, K., Zhi, C. Y., Tang, C. C., Bando, Y., & Lourie, O. (2006). In situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope. APPLIED PHYSICS LETTERS, 88(12), 3 pages. doi:10.1063/1.2186987

Digital Object Identifier (doi)

• 10.1063/1.2186987

Web Of Science Accession Number

• WOS:000236250100096

Number Of Pages

• 3

Volume

• 88

Issue

• 12

Place Of Publication