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In situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope

Journal Article


Abstract


Publication Date


  • 2006

Citation


  • Golberg, D., Mitome, M., Kurashima, K., Zhi, C. Y., Tang, C. C., Bando, Y., & Lourie, O. (2006). In situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope. APPLIED PHYSICS LETTERS, 88(12), 3 pages. doi:10.1063/1.2186987

Number Of Pages


  • 3

Volume


  • 88

Issue


  • 12

Place Of Publication


Abstract


Publication Date


  • 2006

Citation


  • Golberg, D., Mitome, M., Kurashima, K., Zhi, C. Y., Tang, C. C., Bando, Y., & Lourie, O. (2006). In situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope. APPLIED PHYSICS LETTERS, 88(12), 3 pages. doi:10.1063/1.2186987

Number Of Pages


  • 3

Volume


  • 88

Issue


  • 12

Place Of Publication