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Characterization of amorphous and crystalline silicon nanoclusters in ultra thin silica layers

Journal Article


Abstract


Publication Date


  • 2008

Citation


  • Thogersen, A., Mayandi, J., Finstad, T. G., Olsen, A., Christensen, J. S., Mitome, M., & Bando, Y. (2008). Characterization of amorphous and crystalline silicon nanoclusters in ultra thin silica layers. JOURNAL OF APPLIED PHYSICS, 104(9), 7 pages. doi:10.1063/1.3014195

Number Of Pages


  • 7

Volume


  • 104

Issue


  • 9

Place Of Publication


Abstract


Publication Date


  • 2008

Citation


  • Thogersen, A., Mayandi, J., Finstad, T. G., Olsen, A., Christensen, J. S., Mitome, M., & Bando, Y. (2008). Characterization of amorphous and crystalline silicon nanoclusters in ultra thin silica layers. JOURNAL OF APPLIED PHYSICS, 104(9), 7 pages. doi:10.1063/1.3014195

Number Of Pages


  • 7

Volume


  • 104

Issue


  • 9

Place Of Publication