Characterization of amorphous and crystalline silicon nanoclusters in ultra thin silica layers

Citation

• Thogersen, A., Mayandi, J., Finstad, T. G., Olsen, A., Christensen, J. S., Mitome, M., & Bando, Y. (2008). Characterization of amorphous and crystalline silicon nanoclusters in ultra thin silica layers. JOURNAL OF APPLIED PHYSICS, 104(9), 7 pages. doi:10.1063/1.3014195

Digital Object Identifier (doi)

• 10.1063/1.3014195

Web Of Science Accession Number

• WOS:000260941700111

Number Of Pages

• 7

Volume

• 104

Issue

• 9

Place Of Publication

Abstract

UOW Authors

•   Bando, Yoshio

Publication Date

• 2008

Publisher

• AMER INST PHYSICS 

Published In

• JOURNAL OF APPLIED PHYSICS  Journal

Citation

• Thogersen, A., Mayandi, J., Finstad, T. G., Olsen, A., Christensen, J. S., Mitome, M., & Bando, Y. (2008). Characterization of amorphous and crystalline silicon nanoclusters in ultra thin silica layers. JOURNAL OF APPLIED PHYSICS, 104(9), 7 pages. doi:10.1063/1.3014195

Digital Object Identifier (doi)

• 10.1063/1.3014195

Web Of Science Accession Number

• WOS:000260941700111

Number Of Pages

• 7

Volume

• 104

Issue

• 9

Place Of Publication