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Czochralski growth and characterization of the piezoelectric single crystal La3Ga5.5Nb0.5O14

Journal Article


Abstract


  • La3Ga5.5Nb0.5O14 crystals are promising materials for bulk acoustic wave and surface acoustic wave applications. In this work, the starting materials for high quality La3Ga5.5Nb0.5O14 single crystal growth were investigated. Adding extra Ga2O3 of 1.0-1.5 wt% to the starting materials was found to be beneficial for high quality crystal growth. High quality La3Ga5.5Nb0.5O14 crystals were grown by the conventional Czochralski method along the X- and Z-axes. Complete sets of dielectric constants, piezoelectric coefficients and elastic constants of La3Ga5.5Nb0.5O14 crystals grown along the X- and Z-axes were determined by a resonance technique and impedance analysis at room temperature, respectively. The relevant constants were obtained and discussed. The obtained results for La3Ga5.5Nb0.5O14 are: ε11T = 19.07, ε33T = 79.06, d11 = - 7.00 pC/N, d14 = 5.60 pC/N; s11E=9.60 pm2/N; s12E=-4.65 pm2/N; s13E=-2.05 pm2/N; s14E=-3.60 pm2/N; s33E=5.77 pm2/N; s44E=23.60 pm2/N and s66E=28.50 pm2/N, respectively. © 2009 Elsevier Ltd. All rights reserved.

Publication Date


  • 2009

Citation


  • Yu, F. P., Yuan, D. R., Yin, X., Zhang, S. J., Pan, L. H., Guo, S. Y., . . . Zhao, X. (2009). Czochralski growth and characterization of the piezoelectric single crystal La3Ga5.5Nb0.5O14. Solid State Communications, 149(31-32), 1278-1281. doi:10.1016/j.ssc.2009.05.010

Scopus Eid


  • 2-s2.0-67649212073

Start Page


  • 1278

End Page


  • 1281

Volume


  • 149

Issue


  • 31-32

Abstract


  • La3Ga5.5Nb0.5O14 crystals are promising materials for bulk acoustic wave and surface acoustic wave applications. In this work, the starting materials for high quality La3Ga5.5Nb0.5O14 single crystal growth were investigated. Adding extra Ga2O3 of 1.0-1.5 wt% to the starting materials was found to be beneficial for high quality crystal growth. High quality La3Ga5.5Nb0.5O14 crystals were grown by the conventional Czochralski method along the X- and Z-axes. Complete sets of dielectric constants, piezoelectric coefficients and elastic constants of La3Ga5.5Nb0.5O14 crystals grown along the X- and Z-axes were determined by a resonance technique and impedance analysis at room temperature, respectively. The relevant constants were obtained and discussed. The obtained results for La3Ga5.5Nb0.5O14 are: ε11T = 19.07, ε33T = 79.06, d11 = - 7.00 pC/N, d14 = 5.60 pC/N; s11E=9.60 pm2/N; s12E=-4.65 pm2/N; s13E=-2.05 pm2/N; s14E=-3.60 pm2/N; s33E=5.77 pm2/N; s44E=23.60 pm2/N and s66E=28.50 pm2/N, respectively. © 2009 Elsevier Ltd. All rights reserved.

Publication Date


  • 2009

Citation


  • Yu, F. P., Yuan, D. R., Yin, X., Zhang, S. J., Pan, L. H., Guo, S. Y., . . . Zhao, X. (2009). Czochralski growth and characterization of the piezoelectric single crystal La3Ga5.5Nb0.5O14. Solid State Communications, 149(31-32), 1278-1281. doi:10.1016/j.ssc.2009.05.010

Scopus Eid


  • 2-s2.0-67649212073

Start Page


  • 1278

End Page


  • 1281

Volume


  • 149

Issue


  • 31-32