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Chain reorientation in ß-PVDF films upon transverse mechanical deformation studied by SEM and dielectric relaxation

Conference Paper


Abstract


  • Chain reorientation may be induced in polyvinylidene fluoride (PVDF) in its β -phase by applying a deformation perpendicular to the pre-oriented polymeric chains. This reorientation begins right after the yielding point and seems to be completed when the stress-strain curve stabilizes. We have studied the chain reorientation mechanism by scanning electron microscopy (SEM) and dielectric relaxation methods and we have analyzed its influence in the α - and β -relaxations of the polymer. SEM images confirm the existence of a reorientation upon transversal deformation. The decrease of crystallinity with increasing reorientation and the dependence of the dielectric permittivity upon deformation indicate that a model of stress-induced melting followed by an incomplete recrystallization properly describes the reorientation mechanism.

Publication Date


  • 2003

Citation


  • Barbosa, R., Mendes, J. A., Sencadas, V., Mano, J. F., & Lanceros-Méndez, S. (2003). Chain reorientation in ß-PVDF films upon transverse mechanical deformation studied by SEM and dielectric relaxation. In Ferroelectrics Vol. 294 (pp. 73-83). doi:10.1080/00150190390238630

Scopus Eid


  • 2-s2.0-14644416939

Start Page


  • 73

End Page


  • 83

Volume


  • 294

Abstract


  • Chain reorientation may be induced in polyvinylidene fluoride (PVDF) in its β -phase by applying a deformation perpendicular to the pre-oriented polymeric chains. This reorientation begins right after the yielding point and seems to be completed when the stress-strain curve stabilizes. We have studied the chain reorientation mechanism by scanning electron microscopy (SEM) and dielectric relaxation methods and we have analyzed its influence in the α - and β -relaxations of the polymer. SEM images confirm the existence of a reorientation upon transversal deformation. The decrease of crystallinity with increasing reorientation and the dependence of the dielectric permittivity upon deformation indicate that a model of stress-induced melting followed by an incomplete recrystallization properly describes the reorientation mechanism.

Publication Date


  • 2003

Citation


  • Barbosa, R., Mendes, J. A., Sencadas, V., Mano, J. F., & Lanceros-Méndez, S. (2003). Chain reorientation in ß-PVDF films upon transverse mechanical deformation studied by SEM and dielectric relaxation. In Ferroelectrics Vol. 294 (pp. 73-83). doi:10.1080/00150190390238630

Scopus Eid


  • 2-s2.0-14644416939

Start Page


  • 73

End Page


  • 83

Volume


  • 294