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Design, fabrication, and test of CMOS active-pixel radiation sensors

Conference Paper


Abstract


  • In this paper, we discuss some issues related to the design, implementation, and test of a CMOS active pixel sensor chip (RAPS01), developed in the framework of the radiation active pixel sensors (RAPS) INFN project. Two different basic pixel schemes have been proposed. The first one is based on a standard active pixel sensor (APS) architecture, while a second architecture, named weak inversion pixel sensor (WIPS) exploits a different circuitry which allows for "sparse" access mode and thus for speeding-up the readout phase. Chip fabrication has been completed and a preliminary test phase has been performed. A suitable test environment has been devised and test strategies have been planned. Preliminary test results, featuring a static and dynamic characterization of the basic sensitive elements are outlined. Future works are also outlined, aimed at the optimization of a second version of the chip, more effectively integrating smart circuitry.

Publication Date


  • 2004

Citation


  • Passeri, D., Placidi, P., Petasecca, M., Ciampolini, P., Matrella, G., Marras, A., . . . Bilei, G. M. (2004). Design, fabrication, and test of CMOS active-pixel radiation sensors. In IEEE Transactions on Nuclear Science Vol. 51 (pp. 1144-1149). doi:10.1109/TNS.2004.829449

Scopus Eid


  • 2-s2.0-3342996172

Start Page


  • 1144

End Page


  • 1149

Volume


  • 51

Issue


  • 3 III

Abstract


  • In this paper, we discuss some issues related to the design, implementation, and test of a CMOS active pixel sensor chip (RAPS01), developed in the framework of the radiation active pixel sensors (RAPS) INFN project. Two different basic pixel schemes have been proposed. The first one is based on a standard active pixel sensor (APS) architecture, while a second architecture, named weak inversion pixel sensor (WIPS) exploits a different circuitry which allows for "sparse" access mode and thus for speeding-up the readout phase. Chip fabrication has been completed and a preliminary test phase has been performed. A suitable test environment has been devised and test strategies have been planned. Preliminary test results, featuring a static and dynamic characterization of the basic sensitive elements are outlined. Future works are also outlined, aimed at the optimization of a second version of the chip, more effectively integrating smart circuitry.

Publication Date


  • 2004

Citation


  • Passeri, D., Placidi, P., Petasecca, M., Ciampolini, P., Matrella, G., Marras, A., . . . Bilei, G. M. (2004). Design, fabrication, and test of CMOS active-pixel radiation sensors. In IEEE Transactions on Nuclear Science Vol. 51 (pp. 1144-1149). doi:10.1109/TNS.2004.829449

Scopus Eid


  • 2-s2.0-3342996172

Start Page


  • 1144

End Page


  • 1149

Volume


  • 51

Issue


  • 3 III