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In-situ synchrotron X-ray diffraction study of stress-induced phase transformation in Ti50.1Ni40.8Cu9.1 thin films

Journal Article


Abstract


Publication Date


  • 2012

Citation


  • Wang, H., Sun, G. A., Chen, B., Fu, Y. Q., Wang, X. L., Zu, X. T., . . . Tian, Q. (2012). In-situ synchrotron X-ray diffraction study of stress-induced phase transformation in Ti50.1Ni40.8Cu9.1 thin films. Physica B Condensed Matter, 407(17), 3437-3440. doi:10.1016/j.physb.2012.04.054

Web Of Science Accession Number


Start Page


  • 3437

End Page


  • 3440

Volume


  • 407

Issue


  • 17

Abstract


Publication Date


  • 2012

Citation


  • Wang, H., Sun, G. A., Chen, B., Fu, Y. Q., Wang, X. L., Zu, X. T., . . . Tian, Q. (2012). In-situ synchrotron X-ray diffraction study of stress-induced phase transformation in Ti50.1Ni40.8Cu9.1 thin films. Physica B Condensed Matter, 407(17), 3437-3440. doi:10.1016/j.physb.2012.04.054

Web Of Science Accession Number


Start Page


  • 3437

End Page


  • 3440

Volume


  • 407

Issue


  • 17