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Origin of current broadening in resonant tunneling via localised states

Conference Paper


Abstract


  • It is found that in electron resonant tunneling via localised states, the current exhibits a very strong temperature dependence and power nonconservation. This subtle behaviour is due to the impurity states induced tunneling which is subsequently renormalised by an overlap integral of many-electron states in the emitter. By using a temperature-dependent dynamical approach, an analysis of this interesting tunneling process is performed. It is found that the temperature dependence of the current has a very different origin from the thermal activation. It is also found that plasmon excitation in the emitter further renormalises the tunneling current by a factor of two to three orders of magnitude.

Publication Date


  • 1996

Citation


  • Zhang, C., Fisher, D. J., & Stewart, S. M. (1996). Origin of current broadening in resonant tunneling via localised states. In Surface Science Vol. 361-362 (pp. 231-234). doi:10.1016/0039-6028(96)00391-3

Scopus Eid


  • 2-s2.0-0030189506

Start Page


  • 231

End Page


  • 234

Volume


  • 361-362

Abstract


  • It is found that in electron resonant tunneling via localised states, the current exhibits a very strong temperature dependence and power nonconservation. This subtle behaviour is due to the impurity states induced tunneling which is subsequently renormalised by an overlap integral of many-electron states in the emitter. By using a temperature-dependent dynamical approach, an analysis of this interesting tunneling process is performed. It is found that the temperature dependence of the current has a very different origin from the thermal activation. It is also found that plasmon excitation in the emitter further renormalises the tunneling current by a factor of two to three orders of magnitude.

Publication Date


  • 1996

Citation


  • Zhang, C., Fisher, D. J., & Stewart, S. M. (1996). Origin of current broadening in resonant tunneling via localised states. In Surface Science Vol. 361-362 (pp. 231-234). doi:10.1016/0039-6028(96)00391-3

Scopus Eid


  • 2-s2.0-0030189506

Start Page


  • 231

End Page


  • 234

Volume


  • 361-362