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A system for radiation damage monitoring

Conference Paper


Abstract

  • An automatic radiation damage monitoring system has been developed and tested. The system is based on two passive sensors for the measurement of integral ionizing and non-ionizing energy losses in silicon devices. Ionizing dose is measured in terms of dose in SiO and displacement damage in terms of 1 MeV(Si) equivalent neutron fluence. The system uses MOSFETs and PIN dosimetric diodes. © 1999 IEEE.

Publication Date

  • 1999

Citation

  • Rosenfeld, A. B., Reinhard, M. I., Marinaro, D., & Ihnat, P. (1999). A system for radiation damage monitoring. In IEEE Transactions on Nuclear Science Vol. 46 (pp. 1766-1773). doi:10.1109/23.819152

Scopus Eid

  • 2-s2.0-0033314602

Start Page

  • 1766

End Page

  • 1773

Volume

  • 46

Issue

  • 6 PART 1

Abstract

  • An automatic radiation damage monitoring system has been developed and tested. The system is based on two passive sensors for the measurement of integral ionizing and non-ionizing energy losses in silicon devices. Ionizing dose is measured in terms of dose in SiO and displacement damage in terms of 1 MeV(Si) equivalent neutron fluence. The system uses MOSFETs and PIN dosimetric diodes. © 1999 IEEE.

Publication Date

  • 1999

Citation

  • Rosenfeld, A. B., Reinhard, M. I., Marinaro, D., & Ihnat, P. (1999). A system for radiation damage monitoring. In IEEE Transactions on Nuclear Science Vol. 46 (pp. 1766-1773). doi:10.1109/23.819152

Scopus Eid

  • 2-s2.0-0033314602

Start Page

  • 1766

End Page

  • 1773

Volume

  • 46

Issue

  • 6 PART 1