A system for radiation damage monitoring

Citation

• Rosenfeld, A. B., Reinhard, M. I., Marinaro, D., & Ihnat, P. (1999). A system for radiation damage monitoring. In IEEE Transactions on Nuclear Science Vol. 46 (pp. 1766-1773). doi:10.1109/23.819152

Digital Object Identifier (doi)

• 10.1109/23.819152

Scopus Eid

• 2-s2.0-0033314602

Web Of Science Accession Number

• WOS:000085058500066

Start Page

• 1766

End Page

• 1773

Volume

• 46

Issue

• 6 PART 1

Place Of Publication

Abstract

• An automatic radiation damage monitoring system has been developed and tested. The system is based on two passive sensors for the measurement of integral ionizing and non-ionizing energy losses in silicon devices. Ionizing dose is measured in terms of dose in SiO and displacement damage in terms of 1 MeV(Si) equivalent neutron fluence. The system uses MOSFETs and PIN dosimetric diodes. �� 1999 IEEE.

UOW Authors

•   Lerch, Michael
•   Rosenfeld, Anatoly B.

Publication Date

• 1999

Publisher

• Institute of Electrical and Electronics Engineers (IEEE) 

Citation

• Rosenfeld, A. B., Reinhard, M. I., Marinaro, D., & Ihnat, P. (1999). A system for radiation damage monitoring. In IEEE Transactions on Nuclear Science Vol. 46 (pp. 1766-1773). doi:10.1109/23.819152

Digital Object Identifier (doi)

• 10.1109/23.819152

Scopus Eid

• 2-s2.0-0033314602

Web Of Science Accession Number

• WOS:000085058500066

Start Page

• 1766

End Page

• 1773

Volume

• 46

Issue

• 6 PART 1

Place Of Publication