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Charge collection and radiation hardness of a SOI microdosimeter for medical and space applications

Conference Paper


Abstract


  • The first results obtained using a SOI device for microdosimetry applications are presented. Microbeam and broadbeam spectroscopy methods are used for determining minority carrier lifetime and radiation damage constants. A spectroscopy model is presented which includes the majority of effects that impact spectral resolution. Charge collection statistics were found to substantially affect spectral resolution. Lateral diffusion effects significantly complicate charge collection. © 1998 IEEE.

Publication Date


  • 1998

Citation


  • Bradley, P. D., Rosenfeld, A. B., Lee, K. K., Jamieson, D. N., Heiser, G., & Satoh, S. (1998). Charge collection and radiation hardness of a SOI microdosimeter for medical and space applications. In IEEE Transactions on Nuclear Science Vol. 45 (pp. 2700-2710). doi:10.1109/23.736518

Scopus Eid


  • 2-s2.0-0032243685

Start Page


  • 2700

End Page


  • 2710

Volume


  • 45

Issue


  • 6 PART 1

Abstract


  • The first results obtained using a SOI device for microdosimetry applications are presented. Microbeam and broadbeam spectroscopy methods are used for determining minority carrier lifetime and radiation damage constants. A spectroscopy model is presented which includes the majority of effects that impact spectral resolution. Charge collection statistics were found to substantially affect spectral resolution. Lateral diffusion effects significantly complicate charge collection. © 1998 IEEE.

Publication Date


  • 1998

Citation


  • Bradley, P. D., Rosenfeld, A. B., Lee, K. K., Jamieson, D. N., Heiser, G., & Satoh, S. (1998). Charge collection and radiation hardness of a SOI microdosimeter for medical and space applications. In IEEE Transactions on Nuclear Science Vol. 45 (pp. 2700-2710). doi:10.1109/23.736518

Scopus Eid


  • 2-s2.0-0032243685

Start Page


  • 2700

End Page


  • 2710

Volume


  • 45

Issue


  • 6 PART 1