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Ion beam induced charge collection time imaging of a silicon microdosimeter

Conference Paper


Abstract

  • The ion beam induced charge (IBIC) collection time imaging of a silicon microdosimeter was discussed. The zero-crossing time parameter was found to increase as a function of the distance of ion strike from the pn junction. The measurements were used with a pulse shape discrimination technique to render the microdosimeter insensitive to ion strikes outside the ideal sensitive volume.

Publication Date

  • 2003

Citation

  • Cornelius, I. M., Orlic, I., Siegele, R., Rosenfeld, A. B., & Cohen, D. D. (2003). Ion beam induced charge collection time imaging of a silicon microdosimeter. In Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms Vol. 210 (pp. 191-195). doi:10.1016/S0168-583X(03)01068-1

Scopus Eid

  • 2-s2.0-0042013103

Start Page

  • 191

End Page

  • 195

Volume

  • 210

Abstract

  • The ion beam induced charge (IBIC) collection time imaging of a silicon microdosimeter was discussed. The zero-crossing time parameter was found to increase as a function of the distance of ion strike from the pn junction. The measurements were used with a pulse shape discrimination technique to render the microdosimeter insensitive to ion strikes outside the ideal sensitive volume.

Publication Date

  • 2003

Citation

  • Cornelius, I. M., Orlic, I., Siegele, R., Rosenfeld, A. B., & Cohen, D. D. (2003). Ion beam induced charge collection time imaging of a silicon microdosimeter. In Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms Vol. 210 (pp. 191-195). doi:10.1016/S0168-583X(03)01068-1

Scopus Eid

  • 2-s2.0-0042013103

Start Page

  • 191

End Page

  • 195

Volume

  • 210