Ion beam induced charge collection time imaging of a silicon microdosimeter

Citation

• Cornelius, I. M., Orlic, I., Siegele, R., Rosenfeld, A. B., & Cohen, D. D. (2003). Ion beam induced charge collection time imaging of a silicon microdosimeter. In Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms Vol. 210 (pp. 191-195). doi:10.1016/S0168-583X(03)01068-1

Digital Object Identifier (doi)

• 10.1016/S0168-583X(03)01068-1

Scopus Eid

• 2-s2.0-0042013103

Web Of Science Accession Number

• WOS:000185352300036

Start Page

• 191

End Page

• 195

Volume

• 210

Issue

Place Of Publication

Abstract

• The ion beam induced charge (IBIC) collection time imaging of a silicon microdosimeter was discussed. The zero-crossing time parameter was found to increase as a function of the distance of ion strike from the pn junction. The measurements were used with a pulse shape discrimination technique to render the microdosimeter insensitive to ion strikes outside the ideal sensitive volume.

UOW Authors

•   Cornelius, Iwan (external author)
•   Rosenfeld, Anatoly B.

Publication Date

• 2003

Publisher

• Elsevier BV 

Citation

• Cornelius, I. M., Orlic, I., Siegele, R., Rosenfeld, A. B., & Cohen, D. D. (2003). Ion beam induced charge collection time imaging of a silicon microdosimeter. In Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms Vol. 210 (pp. 191-195). doi:10.1016/S0168-583X(03)01068-1

Digital Object Identifier (doi)

• 10.1016/S0168-583X(03)01068-1

Scopus Eid

• 2-s2.0-0042013103

Web Of Science Accession Number

• WOS:000185352300036

Start Page

• 191

End Page

• 195

Volume

• 210

Issue

Place Of Publication