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Two-Probe Electrical Measurements in Transmission Electron Microscopes-Behavioral Control of Tungsten Microwires

Journal Article


Abstract


Publication Date


  • 2009

Citation


  • Costa, P. M. F. J., Fang, X., Wang, S., He, Y., Bando, Y., Mitome, M., . . . Golberg, D. (2009). Two-Probe Electrical Measurements in Transmission Electron Microscopes-Behavioral Control of Tungsten Microwires. MICROSCOPY RESEARCH AND TECHNIQUE, 72(2), 93-100. doi:10.1002/jemt.20648

Number Of Pages


  • 8

Start Page


  • 93

End Page


  • 100

Volume


  • 72

Issue


  • 2

Place Of Publication


Abstract


Publication Date


  • 2009

Citation


  • Costa, P. M. F. J., Fang, X., Wang, S., He, Y., Bando, Y., Mitome, M., . . . Golberg, D. (2009). Two-Probe Electrical Measurements in Transmission Electron Microscopes-Behavioral Control of Tungsten Microwires. MICROSCOPY RESEARCH AND TECHNIQUE, 72(2), 93-100. doi:10.1002/jemt.20648

Number Of Pages


  • 8

Start Page


  • 93

End Page


  • 100

Volume


  • 72

Issue


  • 2

Place Of Publication