Two-Probe Electrical Measurements in Transmission Electron Microscopes-Behavioral Control of Tungsten Microwires

Citation

• Costa, P. M. F. J., Fang, X., Wang, S., He, Y., Bando, Y., Mitome, M., . . . Golberg, D. (2009). Two-Probe Electrical Measurements in Transmission Electron Microscopes-Behavioral Control of Tungsten Microwires. MICROSCOPY RESEARCH AND TECHNIQUE, 72(2), 93-100. doi:10.1002/jemt.20648

Digital Object Identifier (doi)

• 10.1002/jemt.20648

Web Of Science Accession Number

• WOS:000263511100006

Number Of Pages

• 8

Start Page

• 93

End Page

• 100

Volume

• 72

Issue

• 2

Place Of Publication

Abstract

UOW Authors

•   Bando, Yoshio

Publication Date

• 2009

Publisher

• WILEY 

Published In

• MICROSCOPY RESEARCH AND TECHNIQUE  Journal

Citation

• Costa, P. M. F. J., Fang, X., Wang, S., He, Y., Bando, Y., Mitome, M., . . . Golberg, D. (2009). Two-Probe Electrical Measurements in Transmission Electron Microscopes-Behavioral Control of Tungsten Microwires. MICROSCOPY RESEARCH AND TECHNIQUE, 72(2), 93-100. doi:10.1002/jemt.20648

Digital Object Identifier (doi)

• 10.1002/jemt.20648

Web Of Science Accession Number

• WOS:000263511100006

Number Of Pages

• 8

Start Page

• 93

End Page

• 100

Volume

• 72

Issue

• 2

Place Of Publication