Current Imaging and Electromigration-Induced Splitting of GaN Nanowires As Revealed by Conductive Atomic Force Microscopy

Citation

• Li, C., Bando, Y., & Golberg, D. (2010). Current Imaging and Electromigration-Induced Splitting of GaN Nanowires As Revealed by Conductive Atomic Force Microscopy. ACS NANO, 4(4), 2422-2428. doi:10.1021/nn100223j

Digital Object Identifier (doi)

• 10.1021/nn100223j

Web Of Science Accession Number

• WOS:000276956800078

Number Of Pages

• 7

Start Page

• 2422

End Page

• 2428

Volume

• 4

Issue

• 4

Place Of Publication

Abstract

UOW Authors

•   Bando, Yoshio

Publication Date

• 2010

Publisher

• AMER CHEMICAL SOC 

Published In

• ACS NANO  Journal

Citation

• Li, C., Bando, Y., & Golberg, D. (2010). Current Imaging and Electromigration-Induced Splitting of GaN Nanowires As Revealed by Conductive Atomic Force Microscopy. ACS NANO, 4(4), 2422-2428. doi:10.1021/nn100223j

Digital Object Identifier (doi)

• 10.1021/nn100223j

Web Of Science Accession Number

• WOS:000276956800078

Number Of Pages

• 7

Start Page

• 2422

End Page

• 2428

Volume

• 4

Issue

• 4

Place Of Publication