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Current Imaging and Electromigration-Induced Splitting of GaN Nanowires As Revealed by Conductive Atomic Force Microscopy

Journal Article


Abstract


Publication Date


  • 2010

Citation


  • Li, C., Bando, Y., & Golberg, D. (2010). Current Imaging and Electromigration-Induced Splitting of GaN Nanowires As Revealed by Conductive Atomic Force Microscopy. ACS NANO, 4(4), 2422-2428. doi:10.1021/nn100223j

Number Of Pages


  • 7

Start Page


  • 2422

End Page


  • 2428

Volume


  • 4

Issue


  • 4

Place Of Publication


Abstract


Publication Date


  • 2010

Citation


  • Li, C., Bando, Y., & Golberg, D. (2010). Current Imaging and Electromigration-Induced Splitting of GaN Nanowires As Revealed by Conductive Atomic Force Microscopy. ACS NANO, 4(4), 2422-2428. doi:10.1021/nn100223j

Number Of Pages


  • 7

Start Page


  • 2422

End Page


  • 2428

Volume


  • 4

Issue


  • 4

Place Of Publication