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Characterization of Impurity Doping and Stress in Si/Ge and Ge/Si Core-Shell Nanowires

Journal Article


Abstract


Publication Date


  • 2012

Citation


  • Fukata, N., Mitome, M., Sekiguchi, T., Bando, Y., Kirkham, M., Hong, J. -I., . . . Snydert, R. L. (2012). Characterization of Impurity Doping and Stress in Si/Ge and Ge/Si Core-Shell Nanowires. ACS NANO, 6(10), 8887-8895. doi:10.1021/nn302881w

Number Of Pages


  • 9

Start Page


  • 8887

End Page


  • 8895

Volume


  • 6

Issue


  • 10

Place Of Publication


Abstract


Publication Date


  • 2012

Citation


  • Fukata, N., Mitome, M., Sekiguchi, T., Bando, Y., Kirkham, M., Hong, J. -I., . . . Snydert, R. L. (2012). Characterization of Impurity Doping and Stress in Si/Ge and Ge/Si Core-Shell Nanowires. ACS NANO, 6(10), 8887-8895. doi:10.1021/nn302881w

Number Of Pages


  • 9

Start Page


  • 8887

End Page


  • 8895

Volume


  • 6

Issue


  • 10

Place Of Publication