In situ fabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope

Citation

• Zhang, C., Xu, Z., Tian, W., Tang, D. -M., Wang, X., Bando, Y., . . . Golberg, D. (2015). In situ fabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope. NANOTECHNOLOGY, 26(15), 8 pages. doi:10.1088/0957-4484/26/15/154001

Digital Object Identifier (doi)

• 10.1088/0957-4484/26/15/154001

Web Of Science Accession Number

• WOS:000352636100001

Number Of Pages

• 8

Volume

• 26

Issue

• 15

Place Of Publication

Abstract

UOW Authors

•   Bando, Yoshio

Publication Date

• 2015

Publisher

• IOP PUBLISHING LTD 

Published In

• NANOTECHNOLOGY  Journal

Citation

• Zhang, C., Xu, Z., Tian, W., Tang, D. -M., Wang, X., Bando, Y., . . . Golberg, D. (2015). In situ fabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope. NANOTECHNOLOGY, 26(15), 8 pages. doi:10.1088/0957-4484/26/15/154001

Digital Object Identifier (doi)

• 10.1088/0957-4484/26/15/154001

Web Of Science Accession Number

• WOS:000352636100001

Number Of Pages

• 8

Volume

• 26

Issue

• 15

Place Of Publication