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Semiconductor dosimetry in modern external-beam radiation therapy

Journal Article


Abstract


  • Semiconductor dosimeters are ubiquitous in modern external-beam radiation therapy. They possess key features. The response, electronically available in real time, is stable and linear with absorbed dose for given irradiation conditions; the radiation-sensitive volume can be rather small in size, while retaining mechanical strength and high sensitivity. We describe three common semiconductor dosimeters: diodes, metal-oxide-semiconductor field-effect transistors and diamonds. We discuss in detail their operation principles and applications in modern external-beam radiation therapy, primarily with megavoltage photon beams. We also explore their use in proton and heavy ion therapy, and in experimental radiotherapy techniques such as synchrotron-based micro-beam radiation therapy.

Publication Date


  • 2020

Citation


  • Rosenfeld, A. B., Biasi, G., Petasecca, M., Lerch, M. L. F., Villani, G., & Feygelman, V. (2020). Semiconductor dosimetry in modern external-beam radiation therapy. Physics in Medicine and Biology, 65(16). doi:10.1088/1361-6560/aba163

Scopus Eid


  • 2-s2.0-85095972256

Volume


  • 65

Issue


  • 16

Abstract


  • Semiconductor dosimeters are ubiquitous in modern external-beam radiation therapy. They possess key features. The response, electronically available in real time, is stable and linear with absorbed dose for given irradiation conditions; the radiation-sensitive volume can be rather small in size, while retaining mechanical strength and high sensitivity. We describe three common semiconductor dosimeters: diodes, metal-oxide-semiconductor field-effect transistors and diamonds. We discuss in detail their operation principles and applications in modern external-beam radiation therapy, primarily with megavoltage photon beams. We also explore their use in proton and heavy ion therapy, and in experimental radiotherapy techniques such as synchrotron-based micro-beam radiation therapy.

Publication Date


  • 2020

Citation


  • Rosenfeld, A. B., Biasi, G., Petasecca, M., Lerch, M. L. F., Villani, G., & Feygelman, V. (2020). Semiconductor dosimetry in modern external-beam radiation therapy. Physics in Medicine and Biology, 65(16). doi:10.1088/1361-6560/aba163

Scopus Eid


  • 2-s2.0-85095972256

Volume


  • 65

Issue


  • 16