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Enhancement of the magnetic interfacial exchange energy at a specific interface in NiFe/CoO/Co trilayer thin films via ion-beam modification

Journal Article


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Abstract


  • A series of ferromagnetic Ni80Fe20(55 nm)/antiferromagnetic CoO (25 to 200 nm)/ferromagnetic

    Co (55 nm)/SiO2(substrate) trilayer thin films were fabricated by ion-beam assisted deposition in

    order to understand the role of ion beam modification on the interfacial and interlayer coupling.

    The microstructural study using transmission electron microscopy, X-ray reflectometry, and

    polarised neutron reflectometry showed that ion-beam modification during the deposition process

    led to an oxygen-rich Co/CoO nanocomposite interface region at the bottom layer. This interface

    caused a high exchange bias field for the ferromagnetic cobalt. However, the exchange bias for

    top permalloy ferromagnet remained low, in line with expectations from the literature for the

    typical interfacial energy. This suggest that the ion-beam enhancement of the magnetic exchange

    bias is localized to the Co/CoO interface where local microstructural effects provide the

    dominant mechanism.

UOW Authors


  •   Cortie, David
  •   Ting, Y. W (external author)
  •   Chen, Pei-Shi (external author)
  •   Tan, X (external author)
  •   Lin, Ko-Wei (external author)
  •   Klose, Frank (external author)

Publication Date


  • 2014

Citation


  • Cortie, D. L., Ting, Y., Chen, P., Tan, X., Lin, K. & Klose, F. (2014). Enhancement of the magnetic interfacial exchange energy at a specific interface in NiFe/CoO/Co trilayer thin films via ion-beam modification. Journal of Applied Physics, 115 (17), 073901-1-073901-7.

Scopus Eid


  • 2-s2.0-84898928558

Ro Full-text Url


  • http://ro.uow.edu.au/cgi/viewcontent.cgi?article=2215&context=aiimpapers

Ro Metadata Url


  • http://ro.uow.edu.au/aiimpapers/1214

Start Page


  • 073901-1

End Page


  • 073901-7

Volume


  • 115

Issue


  • 17

Abstract


  • A series of ferromagnetic Ni80Fe20(55 nm)/antiferromagnetic CoO (25 to 200 nm)/ferromagnetic

    Co (55 nm)/SiO2(substrate) trilayer thin films were fabricated by ion-beam assisted deposition in

    order to understand the role of ion beam modification on the interfacial and interlayer coupling.

    The microstructural study using transmission electron microscopy, X-ray reflectometry, and

    polarised neutron reflectometry showed that ion-beam modification during the deposition process

    led to an oxygen-rich Co/CoO nanocomposite interface region at the bottom layer. This interface

    caused a high exchange bias field for the ferromagnetic cobalt. However, the exchange bias for

    top permalloy ferromagnet remained low, in line with expectations from the literature for the

    typical interfacial energy. This suggest that the ion-beam enhancement of the magnetic exchange

    bias is localized to the Co/CoO interface where local microstructural effects provide the

    dominant mechanism.

UOW Authors


  •   Cortie, David
  •   Ting, Y. W (external author)
  •   Chen, Pei-Shi (external author)
  •   Tan, X (external author)
  •   Lin, Ko-Wei (external author)
  •   Klose, Frank (external author)

Publication Date


  • 2014

Citation


  • Cortie, D. L., Ting, Y., Chen, P., Tan, X., Lin, K. & Klose, F. (2014). Enhancement of the magnetic interfacial exchange energy at a specific interface in NiFe/CoO/Co trilayer thin films via ion-beam modification. Journal of Applied Physics, 115 (17), 073901-1-073901-7.

Scopus Eid


  • 2-s2.0-84898928558

Ro Full-text Url


  • http://ro.uow.edu.au/cgi/viewcontent.cgi?article=2215&context=aiimpapers

Ro Metadata Url


  • http://ro.uow.edu.au/aiimpapers/1214

Start Page


  • 073901-1

End Page


  • 073901-7

Volume


  • 115

Issue


  • 17