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Effect of substrate and buffer layer materials on properties of thin YBa2Cu3O7-x films

Journal Article


Abstract


  • High-temperature superconducting thin films

    (YBa2Cu3O7−x) are emerging in superconducting single

    photon detector (SSPD) research as a novel replacement for

    conventional and semiconductor detectors. The major hindrance

    for this is the degradation of the superconducting properties of

    YBa2Cu3O7−x (YBCO) thin film with reduction of its lateral

    and longitudinal dimensions (i.e., film thickness and width of the

    stripe). Furthermore, the surface of the film should be smooth

    to enable fabrication of the SSPD device. In order to improve

    the quality of YBCO thin films, we exploited various buffer

    layers (i.e., SrTiO3, CeO2, and PrBa2

    Cu3O7) with thickness

    of 30 ± 5 nm. We have also investigated the properties of

    (65 ± 5-nm-thick) YBCO films grown simultaneously on different

    substrates (i.e., SrTiO3, LaAlO3, MgO, and yttrium stabilized

    zirconia). For some substrate/buffer material combinations,

    the surface morphology of the YBCO film has been effectively

    improved. Also, there was only a small or no degradation of their

    critical temperature values. These structures give a precursor for

    further development of fabrication technology for YBCO-based

    SSPD devices.

Authors


  •   Masilamani, Nandhagopal (external author)
  •   Shcherbakova, Olga V. (external author)
  •   Fedoseev, Sergey (external author)
  •   Pan, Alexey
  •   Dou, Shi Xue

Publication Date


  • 2013

Citation


  • Masilamani, N., Shcherbakova, O. V., Fedoseev, S. A., Pan, A. V. & Dou, S. X. (2013). Effect of substrate and buffer layer materials on properties of thin YBa2Cu3O7-x films. IEEE Transactions on Applied Superconductivity, 23 (3), 6601105-1-6601105-5.

Scopus Eid


  • 2-s2.0-84873363469

Ro Metadata Url


  • http://ro.uow.edu.au/aiimpapers/830

Has Global Citation Frequency


Start Page


  • 6601105-1

End Page


  • 6601105-5

Volume


  • 23

Issue


  • 3

Place Of Publication


  • United States

Abstract


  • High-temperature superconducting thin films

    (YBa2Cu3O7−x) are emerging in superconducting single

    photon detector (SSPD) research as a novel replacement for

    conventional and semiconductor detectors. The major hindrance

    for this is the degradation of the superconducting properties of

    YBa2Cu3O7−x (YBCO) thin film with reduction of its lateral

    and longitudinal dimensions (i.e., film thickness and width of the

    stripe). Furthermore, the surface of the film should be smooth

    to enable fabrication of the SSPD device. In order to improve

    the quality of YBCO thin films, we exploited various buffer

    layers (i.e., SrTiO3, CeO2, and PrBa2

    Cu3O7) with thickness

    of 30 ± 5 nm. We have also investigated the properties of

    (65 ± 5-nm-thick) YBCO films grown simultaneously on different

    substrates (i.e., SrTiO3, LaAlO3, MgO, and yttrium stabilized

    zirconia). For some substrate/buffer material combinations,

    the surface morphology of the YBCO film has been effectively

    improved. Also, there was only a small or no degradation of their

    critical temperature values. These structures give a precursor for

    further development of fabrication technology for YBCO-based

    SSPD devices.

Authors


  •   Masilamani, Nandhagopal (external author)
  •   Shcherbakova, Olga V. (external author)
  •   Fedoseev, Sergey (external author)
  •   Pan, Alexey
  •   Dou, Shi Xue

Publication Date


  • 2013

Citation


  • Masilamani, N., Shcherbakova, O. V., Fedoseev, S. A., Pan, A. V. & Dou, S. X. (2013). Effect of substrate and buffer layer materials on properties of thin YBa2Cu3O7-x films. IEEE Transactions on Applied Superconductivity, 23 (3), 6601105-1-6601105-5.

Scopus Eid


  • 2-s2.0-84873363469

Ro Metadata Url


  • http://ro.uow.edu.au/aiimpapers/830

Has Global Citation Frequency


Start Page


  • 6601105-1

End Page


  • 6601105-5

Volume


  • 23

Issue


  • 3

Place Of Publication


  • United States