MOSFET dosimetry with high spatial resolution in intense synchrotron-generated x-ray microbeams

Citation

• Siegbahn, E. A., Brauer-Krisch, E., Bravin, A., Nettelbeck, H., Lerch, M. L. F. & Rozenfeld, A. (2009). MOSFET dosimetry with high spatial resolution in intense synchrotron-generated x-ray microbeams. Medical Physics, 36 (4), 1128-1137.

Digital Object Identifier (doi)

• 10.1118/1.3081934

Scopus Eid

• 2-s2.0-63849241762

Ro Metadata Url

• http://ro.uow.edu.au/engpapers/5431

Number Of Pages

• 9

Start Page

• 1128

End Page

• 1137

Volume

• 36

Issue

• 4

Abstract

UOW Authors

•   Siegbahn, Erik A. (external author)
•   Brauer-Krisch, Elke (external author)
•   Bravin, Alberto (external author)
•   Nettelbeck, Heidi (external author)
•   Lerch, Michael
•   Rosenfeld, Anatoly B.

Publication Date

• 2009

Has Subject Area

• 0299 - OTHER PHYSICAL SCIENCES

Published In

• Medical Physics  Journal

Geographic Focus

• Australia  Country
• France  Country
• Sweden  Country

Citation

• Siegbahn, E. A., Brauer-Krisch, E., Bravin, A., Nettelbeck, H., Lerch, M. L. F. & Rozenfeld, A. (2009). MOSFET dosimetry with high spatial resolution in intense synchrotron-generated x-ray microbeams. Medical Physics, 36 (4), 1128-1137.

Digital Object Identifier (doi)

• 10.1118/1.3081934

Scopus Eid

• 2-s2.0-63849241762

Ro Metadata Url

• http://ro.uow.edu.au/engpapers/5431

Number Of Pages

• 9

Start Page

• 1128

End Page

• 1137

Volume

• 36

Issue

• 4