Carter, S. J. & Lewis, R. A. (1987). The effect of electron beam - specimen - detector geometry on x-ray yields from copper. Scanning: the journal of scanning microscopies, 9 (3), 125-128.
Carter, S. J. & Lewis, R. A. (1987). The effect of electron beam - specimen - detector geometry on x-ray yields from copper. Scanning: the journal of scanning microscopies, 9 (3), 125-128.