The effect of electron beam - specimen - detector geometry on x-ray yields from copper

Citation

• Carter, S. J. & Lewis, R. A. (1987). The effect of electron beam - specimen - detector geometry on x-ray yields from copper. Scanning: the journal of scanning microscopies, 9 (3), 125-128.

Number Of Pages

• 3

Start Page

• 125

End Page

• 128

Volume

• 9

Issue

• 3

Abstract

UOW Authors

•   Lewis, R A.

Publication Date

• 1987

Has Subject Area

• 1112 - ONCOLOGY AND CARCINOGENESIS

Published In

• Scanning: the journal of scanning microscopies  Journal

Citation

• Carter, S. J. & Lewis, R. A. (1987). The effect of electron beam - specimen - detector geometry on x-ray yields from copper. Scanning: the journal of scanning microscopies, 9 (3), 125-128.

Number Of Pages

• 3

Start Page

• 125

End Page

• 128

Volume

• 9

Issue

• 3