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Using polarized neutron reflectometry to resolve effects of light elements and ion exposure on magnetization

Journal Article


Abstract


  • © 2020 Elsevier Inc. This chapter introduces the polarized neutron reflectometry (PNR) technique with a focus on its unique applications to studying the effects of light elements and ion beams in magnetic thin films. The chapter is divided into six sections. Following a brief introduction in Section 1, Section 2 introduces the operational principles and advantages of PNR. Section 3 discusses recent experiments on magnetic hydrogen sensors using in-situ magnetic measurements made on a PNR beam line. Section 4 reviews recent progress using PNR to clarify how low-energy ion beams can modulate the magnetic properties by implantation, modifying oxygen stoichiometry, interface engineering with argon, and imprinting magnetic domains by driving phase transitions. Section 5 exemplifies how PNR can be used to study lateral magnetic domain structures patterned using helium ion beams. Section 6 presents conclusions and future perspectives in form of a brief roadmap highlighting some of the latest developments in PNR, and the new technical possibilities that are anticipated over the coming decade.

UOW Authors


  •   Callori, Sara (external author)
  •   Saerbeck, Thomas (external author)
  •   Cortie, David
  •   Lin, Ko (external author)

Publication Date


  • 2020

Citation


  • Callori, S., Saerbeck, T., Cortie, D. & Lin, K. (2020). Using polarized neutron reflectometry to resolve effects of light elements and ion exposure on magnetization. Solid State Physics - Advances in Research and Applications, 71 73-116.

Scopus Eid


  • 2-s2.0-85095955419

Number Of Pages


  • 43

Start Page


  • 73

End Page


  • 116

Volume


  • 71

Place Of Publication


  • United States

Abstract


  • © 2020 Elsevier Inc. This chapter introduces the polarized neutron reflectometry (PNR) technique with a focus on its unique applications to studying the effects of light elements and ion beams in magnetic thin films. The chapter is divided into six sections. Following a brief introduction in Section 1, Section 2 introduces the operational principles and advantages of PNR. Section 3 discusses recent experiments on magnetic hydrogen sensors using in-situ magnetic measurements made on a PNR beam line. Section 4 reviews recent progress using PNR to clarify how low-energy ion beams can modulate the magnetic properties by implantation, modifying oxygen stoichiometry, interface engineering with argon, and imprinting magnetic domains by driving phase transitions. Section 5 exemplifies how PNR can be used to study lateral magnetic domain structures patterned using helium ion beams. Section 6 presents conclusions and future perspectives in form of a brief roadmap highlighting some of the latest developments in PNR, and the new technical possibilities that are anticipated over the coming decade.

UOW Authors


  •   Callori, Sara (external author)
  •   Saerbeck, Thomas (external author)
  •   Cortie, David
  •   Lin, Ko (external author)

Publication Date


  • 2020

Citation


  • Callori, S., Saerbeck, T., Cortie, D. & Lin, K. (2020). Using polarized neutron reflectometry to resolve effects of light elements and ion exposure on magnetization. Solid State Physics - Advances in Research and Applications, 71 73-116.

Scopus Eid


  • 2-s2.0-85095955419

Number Of Pages


  • 43

Start Page


  • 73

End Page


  • 116

Volume


  • 71

Place Of Publication


  • United States