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Alpha Measurement Using Laser Dynamics

Conference Paper


Abstract


  • The linewidth enhancement factor (alpha) is an important parameter for a semiconductor laser (SL). This paper presents a new method for measuring alpha by using the dynamics of an SL with optical feedback. A self-mixing interferometry (SMI) configuration is used to implement the proposed method. The relaxation oscillation (RO) of an SL with optical feedback carries the information of alpha. Staring from the well-known Lang-Kobayashi (L-K) equations, we investigated the transient behavior of an SL with external optical feedback, and the relationship between SL' \mathbf{s} RO frequency and alpha. By applying FFT on the transient waveform, the RO frequency can be obtained and further used to calculate alpha. This work provides a new technique to the area of alpha measurement.

Publication Date


  • 2018

Citation


  • Y. Ruan, B. Liu, Y. Yu, J. Xi, Q. Guo & J. Tong, "Alpha Measurement Using Laser Dynamics," in IFCS 2018 - IEEE International Frequency Control Symposium, 2018, pp. 1-4.

Scopus Eid


  • 2-s2.0-85061788682

Ro Metadata Url


  • http://ro.uow.edu.au/eispapers1/2436

Start Page


  • 1

End Page


  • 4

Place Of Publication


  • United States

Abstract


  • The linewidth enhancement factor (alpha) is an important parameter for a semiconductor laser (SL). This paper presents a new method for measuring alpha by using the dynamics of an SL with optical feedback. A self-mixing interferometry (SMI) configuration is used to implement the proposed method. The relaxation oscillation (RO) of an SL with optical feedback carries the information of alpha. Staring from the well-known Lang-Kobayashi (L-K) equations, we investigated the transient behavior of an SL with external optical feedback, and the relationship between SL' \mathbf{s} RO frequency and alpha. By applying FFT on the transient waveform, the RO frequency can be obtained and further used to calculate alpha. This work provides a new technique to the area of alpha measurement.

Publication Date


  • 2018

Citation


  • Y. Ruan, B. Liu, Y. Yu, J. Xi, Q. Guo & J. Tong, "Alpha Measurement Using Laser Dynamics," in IFCS 2018 - IEEE International Frequency Control Symposium, 2018, pp. 1-4.

Scopus Eid


  • 2-s2.0-85061788682

Ro Metadata Url


  • http://ro.uow.edu.au/eispapers1/2436

Start Page


  • 1

End Page


  • 4

Place Of Publication


  • United States