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Profile measurement using a self-mixing laser diode

Conference Paper


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Abstract


  • When a fraction of external optical feedback re-enters inside cavity of a laser diode (LD), the laser intensity and its wavelength will thus be altered. The LD in this case is often called as a self-mixing laser diode (SMLD). This paper presents an SMLD for profile measurement. The LD is modulated by the injection current in triangular waveform and a target to be measured is installed on a mechanic scanning device. The reflection light by the target contains its surface profile. The profile information is then carried in the laser intensity and can be pickup by a photodiode packaged in the rear of the LD. We call this modulated laser intensity as self-mixing interferometric (SMI) signal. In this paper, a new algorithm is developed to retrieve the profile from the SMI signal. Results show that the proposed design is able to achieve the measurement of profile with high resolution.

Publication Date


  • 2018

Citation


  • H. Wang, Y. Ruan, L. Cao, Y. Yu, J. Xi, Q. Guo, J. Tong & J. Zhang, "Profile measurement using a self-mixing laser diode," in Semiconductor Lasers and Applications VIII, 2018, pp. 1081211-1-1081211-8.

Scopus Eid


  • 2-s2.0-85058383311

Ro Full-text Url


  • https://ro.uow.edu.au/cgi/viewcontent.cgi?article=3184&context=eispapers1

Ro Metadata Url


  • http://ro.uow.edu.au/eispapers1/2178

Start Page


  • 1081211-1

End Page


  • 1081211-8

Place Of Publication


  • Bellingham, United States

Abstract


  • When a fraction of external optical feedback re-enters inside cavity of a laser diode (LD), the laser intensity and its wavelength will thus be altered. The LD in this case is often called as a self-mixing laser diode (SMLD). This paper presents an SMLD for profile measurement. The LD is modulated by the injection current in triangular waveform and a target to be measured is installed on a mechanic scanning device. The reflection light by the target contains its surface profile. The profile information is then carried in the laser intensity and can be pickup by a photodiode packaged in the rear of the LD. We call this modulated laser intensity as self-mixing interferometric (SMI) signal. In this paper, a new algorithm is developed to retrieve the profile from the SMI signal. Results show that the proposed design is able to achieve the measurement of profile with high resolution.

Publication Date


  • 2018

Citation


  • H. Wang, Y. Ruan, L. Cao, Y. Yu, J. Xi, Q. Guo, J. Tong & J. Zhang, "Profile measurement using a self-mixing laser diode," in Semiconductor Lasers and Applications VIII, 2018, pp. 1081211-1-1081211-8.

Scopus Eid


  • 2-s2.0-85058383311

Ro Full-text Url


  • https://ro.uow.edu.au/cgi/viewcontent.cgi?article=3184&context=eispapers1

Ro Metadata Url


  • http://ro.uow.edu.au/eispapers1/2178

Start Page


  • 1081211-1

End Page


  • 1081211-8

Place Of Publication


  • Bellingham, United States