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An Atomic Force Microscopy Study of Single-Layer FeSe Superconductor

Journal Article


Abstract


  • The single-layer iron selenide (FeSe) superconductor is becoming an ideal system to study the mechanism of high-temperature superconductivity.

    In this work, we use atomic force microscopy (AFM) to demonstrate that: (1) unidirectional stripe in the single-layer FeSe film is purely an

    electronic feature instead of lattice reconstruction; (2) the charge transfer from the SrTiO3 substrate to FeSe plays an important role in inducing

    superconductivity in single-layer FeSe. Both short-range and long-range forces are exploited in the study. The combination of AFM with scanning

    tunneling microscopy opens a new opportunity to investigate the mechanism of high-Tc materials.

UOW Authors


  •   Li, Na (external author)
  •   Li, Zhi
  •   Ding, Hao (external author)
  •   Ji, Shuaihua (external author)
  •   Chen, Xi (external author)
  •   Xue, Qi-Kun (external author)

Publication Date


  • 2013

Geographic Focus


Citation


  • Li, N., Li, Z., Ding, H., Ji, S., Chen, X. & Xue, Q. (2013). An Atomic Force Microscopy Study of Single-Layer FeSe Superconductor. Applied Physics Express, 6 113101-1-113101-4.

Scopus Eid


  • 2-s2.0-84887756453

Start Page


  • 113101-1

End Page


  • 113101-4

Volume


  • 6

Place Of Publication


  • United Kingdom

Abstract


  • The single-layer iron selenide (FeSe) superconductor is becoming an ideal system to study the mechanism of high-temperature superconductivity.

    In this work, we use atomic force microscopy (AFM) to demonstrate that: (1) unidirectional stripe in the single-layer FeSe film is purely an

    electronic feature instead of lattice reconstruction; (2) the charge transfer from the SrTiO3 substrate to FeSe plays an important role in inducing

    superconductivity in single-layer FeSe. Both short-range and long-range forces are exploited in the study. The combination of AFM with scanning

    tunneling microscopy opens a new opportunity to investigate the mechanism of high-Tc materials.

UOW Authors


  •   Li, Na (external author)
  •   Li, Zhi
  •   Ding, Hao (external author)
  •   Ji, Shuaihua (external author)
  •   Chen, Xi (external author)
  •   Xue, Qi-Kun (external author)

Publication Date


  • 2013

Geographic Focus


Citation


  • Li, N., Li, Z., Ding, H., Ji, S., Chen, X. & Xue, Q. (2013). An Atomic Force Microscopy Study of Single-Layer FeSe Superconductor. Applied Physics Express, 6 113101-1-113101-4.

Scopus Eid


  • 2-s2.0-84887756453

Start Page


  • 113101-1

End Page


  • 113101-4

Volume


  • 6

Place Of Publication


  • United Kingdom