An Inferential Metamorphic Testing Approach to Eliminating False Positives in SQLIV Penetration Test

Citation

• Liu, L., Su, G., Xu, J., Zhang, B., Kang, J., Xu, S., Li, P. & Si, G. (2017). An Inferential Metamorphic Testing Approach to Eliminating False Positives in SQLIV Penetration Test. IEEE Computers, Software, and Applications Conference (COMPSAC 2017) (pp. 675-680). United States: IEEE.

Digital Object Identifier (doi)

• 10.1109/COMPSAC.2017.276

Scopus Eid

• 2-s2.0-85031939804

Start Page

• 675

End Page

• 680

Place Of Publication

• United States

Abstract

UOW Authors

•   Liu, Li (external author)
•   Guoxin Su
•   Xu, Vivian (external author)
•   Zhang, Biao (external author)
•   Kang, Jiehui (external author)
•   Xu, Sihan (external author)
•   Li, Peng (external author)
•   Si, Guannan (external author)

Publication Date

• 2017

Has Subject Area

• 0906 - ELECTRICAL AND ELECTRONIC ENGINEERING

Geographic Focus

• Australia  Country
• China  Country

Citation

• Liu, L., Su, G., Xu, J., Zhang, B., Kang, J., Xu, S., Li, P. & Si, G. (2017). An Inferential Metamorphic Testing Approach to Eliminating False Positives in SQLIV Penetration Test. IEEE Computers, Software, and Applications Conference (COMPSAC 2017) (pp. 675-680). United States: IEEE.

Digital Object Identifier (doi)

• 10.1109/COMPSAC.2017.276

Scopus Eid

• 2-s2.0-85031939804

Start Page

• 675

End Page

• 680

Place Of Publication

• United States