Depth-sensitive magnetic, structural, and chemical characterization is important in the understanding and optimization of physical phenomena emerging at the interfaces of transition metal oxide heterostructures. In a simultaneous approach we have used polarized neutron and resonant x-ray reflectometry to determine the magnetic profile across atomically sharp interfaces of ferromagnetic La0.67Sr0.33MnO3/multiferroic BiFeO3 bilayers with subnanometer resolution. In particular, the x-ray resonant magnetic reflectivity measurements at the Fe and Mn resonance edges allowed us to determine the element-specific depth profile of the ferromagnetic moments in both the La0.67Sr0.33MnO3 and BiFeO3 layers. Our measurements indicate a magnetically diluted interface layer within the La0.67Sr0.33MnO3 layer, in contrast to previous observations on inversely deposited layers [P. Yu, Phys. Rev. Lett. 105, 027201 (2010)PRLTAO0031-900710.1103/PhysRevLett.105.027201]. Additional resonant x-ray reflection measurements indicate a region of altered Mn and O content at the interface, with a thickness matching that of the magnetic diluted layer, as the origin of the reduction of the magnetic moment. © 2014 American Physical Society.