placeholder image

An integrated Raman Microscope and in situ STM-TEM Analysis System

Grant


Scheme


  • Linkage Infrastructure Equipment & Facilities (LIEF)

Abstract


  • The proposed Raman microscope integrated with scanning electron microscopy (SEM) and a structural and chemical analyser will be an outstanding characterisation system for a wide range of materials, capable of structural, elemental, morphological and physical characterisation of the same sample region under precisely controlled conditions. The in-situ TEM holder will allow in-situ STM sample characterisations that will provide invaluable information on electrical properties and dynamic processes at specific locations. As a coordinated facility these instruments represent a comprehensive characterisation tool underpinning the work of excellent researchers in advanced nano-materials, polymers and biological systems.

Date/time Interval


  • 2008

Sponsor Award Id


  • LE0882787

Local Award Id


  • 9897

Scheme


  • Linkage Infrastructure Equipment & Facilities (LIEF)

Abstract


  • The proposed Raman microscope integrated with scanning electron microscopy (SEM) and a structural and chemical analyser will be an outstanding characterisation system for a wide range of materials, capable of structural, elemental, morphological and physical characterisation of the same sample region under precisely controlled conditions. The in-situ TEM holder will allow in-situ STM sample characterisations that will provide invaluable information on electrical properties and dynamic processes at specific locations. As a coordinated facility these instruments represent a comprehensive characterisation tool underpinning the work of excellent researchers in advanced nano-materials, polymers and biological systems.

Date/time Interval


  • 2008

Sponsor Award Id


  • LE0882787

Local Award Id


  • 9897