Advanced focused ion beam (FIB) / scanning electron microscopes (SEM) for nanometre scale characterisation and fabrication

Collaborating Organisation

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• The University Of Sydney  Research Organization
• University Of New South Wales  Research Organization

Scheme

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• Linkage Infrastructure Equipment & Facilities (LIEF)

Abstract

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• Current and emerging research areas in the physical and life sciences increasingly require the capacity to both characterise and manipulate samples and devices at the micrometer and nanometer scales. FIB/SEM is a unique research technique that brings together these two capabilities in the one instrument. It is an extremely versatile, high-demand tool, forming an essential part of a large number of research projects in a wide variety of disciplines ranging from engineering to health and the life sciences. This proposal will meet the vital need of the substantial research communities of Sydney and surrounds for access to these advanced systems in central locations.

Date/time Interval

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• 2010

Awarded By

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• Australian Research Council (ARC) 

Contributor

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• Dou, S X. - Chief Investigator

Geographic Focus

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• Australia 

Geographic Focus

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• Australia  Country

Sponsor Award Id

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• LE100100030

Local Award Id

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• 11257